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Chromasens has expanded its Shortwave Infrared (SWIR) imaging portfolio with the allPIXA SWIR 512 line-scan camera for non-destructive inspection of objects in the infrared spectrum. Simple to integrate with its choice of GigE Vision or CameraLink interfaces, this cost-effective SWIR camera enables the detection of minute defects or contaminants that are invisible to the human eye.
Leveraging an uncooled InGaAs sensor, the allPIXA SWIR 512 meets the growing need for imaging in the spectral range of 950nm to 1700 nm with its ability to identify defects and distinguishes objects by absorption, reflection or transmission characteristics. The SWIR sensor can identify water and fat within foods, detect fill levels through non-transparent containers, monitor plant moisture to prevent over/under watering, identify chemicals, and aid in anti-counterfeiting efforts.
Displaying imaging performance far beyond the capabilities of standard cameras, the allPIXA SWIR 512 delivers 512 x 1 resolution and benefits from large 25μm x 25μm square pixels. Larger pixels act as an expanded catchment area for photons feeding in more signal to the sensor and creating significantly less noise. The deeper well of the larger pixels makes it easier to meet optical resolution requirements, reduces imaging saturation, and improves the overall dynamic range of the sensor, even in lower light environments.
The camera can be specified in either GenICam compliant GigE Vision or CameraLink interfaces to enable fast, reliable and cost-effective data transfer up to 40 kHz (40,000 lines per second) of 8-, 10-, and 12-bit images. Both versions have an internal Field-Programmable Gate Array (FPGA) that can be customized for pre-processing for reduced development time.
On the front end, the allPIXA SWIR features a C-mount lens interface that allows customers to select from a myriad of commercial-off-the-shelf lens options, along with offering custom lens adapters on request.
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